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Anomalous X-ray scattering : ウィキペディア英語版 | Anomalous X-ray scattering Anomalous X-ray scattering AXRS or XRAS is a non-destructive determination technique within X-ray diffraction that makes use of the anomalous dispersion that occurs when a wavelength is selected that is in the vicinity of an absorption edge of one of the constituent elements of the sample. It is used in materials research to study nano-meter sized differences in structure. ==Atomic scattering factors==
In X-ray diffraction the scattering factor ''f'' for an atom is roughly proportional to the number of electrons that it possesses. However for wavelengths that approximate those for which the atom strongly absorbs radiation the scattering factor undergoes a change due to anomalous dispersion. The dispersion not only affects the magnitude of the factor but also imparts a phase shift in the elastic collision of the photon. The scattering factor can therefore best be described as a complex number〔 X-ray diffraction in crystals, imperfect crystals and amorphous bodies. A. Guinier. Dover 1994 ISBN 0-486-68011-8 original publication 1963〕 : f= fo + Δf' + i.Δf"
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